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•Minimal footprint
•Dual-view imaging
•High-resolution images with 24-bit color
•Enhanced material discrimination
•Windows Operating System with Intel® Core™ Processor
•Real-time Diagnostics
•High-contrast image analysis



The XIS-7858DVS™ is a dual-view X-Ray Inspection System (XIS) with a small footprint, designed for screening small- to moderately-sized objects in confined locations. Its dual-imaging system delivers two views of scanned objects, allowing operators to manipulate each view independently and examine objects in multiple screening modes simultaneously.
Utilizing Astrophysics’ best-in-class imaging software, the XIS-7858DVS™ allows operators to make quick and thorough inspections of complex bags and parcels. Its superior imaging ensures higher throughput, making it the ideal solution for high-traffic security checkpoints.


Generator:  Dual 180kV  Tunnel Size:  77.8 cm x 57.9 cm (30.6" x 22.8")

Length:  259.7 cm (102.2")  Width:  134.6 cm (53.0")  Height:  147.3 cm (58.0")


More information:

Samiel Alim Diganta

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